8th International Conference
on Non-Contact Atomic Force Microscopy

Bad Essen (Germany) 15. to 18. August 2005

The NC-AFM 2005 continues a series of conferences devoted to research at the frontiers of science and technology of non-contact scanning force microscopy and spectroscopy. The conference series aims at developing the technique for a broad range of applications in the nanosciences with an emphasis on atomic resolution imaging.    >>>

The NC-AFM 2005 is hosted by

IMAGE LOGO Uni Osnabrueck

conference manager   Wolfgang Mikosch
conference chair          Michael Reichling

IMAGE Bad Essen