NC-AFM 2005 Bad Essen Germany

scope

Non-Contact Atomic Force Microscopy (NC-AFM) is a dynamic scanning force microscopy technique mostly performed in the ultra-high vacuum that allows highest resolution imaging of any well prepared surface.

The technique is the only one capable of atomic resolution imaging on insulating surfaces and yields imaging results on semiconductor surfaces that are complementary to those obtained by scanning tunnelling microscopy. Molecular and sub-molecular resolution is now readily obtained on individual molecules as well as self assembled monolayers while biological applications are approached by small amplitude imaging in liquid environment or at cryogenic temperatures.

The method of force spectroscopy allows a chemical characterisation at the atomic scale while Kelvin Probe and related techniques allow highly resolved imaging of charges and variations in work function. The development of the basic knowledge and instrumentation of the technique has always been accompanied by strong activities in theoretical studies on fundamental interaction mechanisms and a simulation and quantitative interpretation of images and spectroscopy results.

The conference welcomes contributions dealing with one or more of the following topics:

1.   Instrumentation and techniques
2.   Small amplitude and lateral force measurements
3.   Atomic resolution imaging on insulating substrates
4.   Atomic resolution imaging on molecular systems
5.   Highest resolution imaging of cluster and biomolecules
6.   Atomic scale manipulation and tunneling phenomena
7.   Theoretical analysis of contrast mechanisms
8.   Simulation of images and virtual SFM systems
9.   Measuring tip-sample interaction potentials and mapping force fields
10. Mechanisms for damping and energy dissipation
11. Tapping mode versus non-contact mode imaging
12. Imaging and spectroscopy in liquid environments
13. Measuring nanoscale charges, work function and magnetic properties
14. Characterisation and modification of force microscopy tips at the atomic scale

The conference in Bad Essen (Germany) continues the series of international conferences that have been held in Osaka, Japan (1998); Pontresina, Switzerland (1999); Hamburg, Germany (2000); Kyoto, Japan (2001); Montreal, Canada (2002); Dingle, Ireland (2003); and Seattle, USA (2004).